14 October 1997 Transient x-ray diffraction and its application to materials science and x-ray optics
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Abstract
Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasma as the x-ray source for transient diffraction.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Allan A. Hauer, Allan A. Hauer, Justin S. Wark, Justin S. Wark, Daniel H. Kalantar, Daniel H. Kalantar, Bruce A. Remington, Bruce A. Remington, Roger A. Kopp, Roger A. Kopp, James A. Cobble, James A. Cobble, Bruce Failor, Bruce Failor, George A. Kyrala, George A. Kyrala, M. Meyers, M. Meyers, R. Springer, R. Springer, Thomas R. Boehly, Thomas R. Boehly, } "Transient x-ray diffraction and its application to materials science and x-ray optics", Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); doi: 10.1117/12.283986; https://doi.org/10.1117/12.283986
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