High Resolution X-Ray Scattering Measurements

Martin V. Zombeck; Heinrich Brauninger; Axel Ondrusch; Peter Predehl

doi:10.1117/12.933152

24 March 1982 High Resolution X-Ray Scattering Measurements

Martin V. Zombeck, Heinrich Brauninger, Axel Ondrusch, Peter Predehl

Proceedings Volume 0316, High Resolution Soft X-Ray Optics; (1982) https://doi.org/10.1117/12.933152
Event: 1981 Brookhaven Conferences, 1981, Upton, United States

Abstract

The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 κeV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.

Citation Download Citation

Martin V. Zombeck, Heinrich Brauninger, Axel Ondrusch, and Peter Predehl "High Resolution X-Ray Scattering Measurements", Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); https://doi.org/10.1117/12.933152

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available