PROCEEDINGS VOLUME 3175
THIRD INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS | 15-17 APRIL 1997
Third International Conference on Thin Film Physics and Applications
THIRD INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS
15-17 April 1997
Shanghai, China
Plenary Session
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 2 (20 February 1998); doi: 10.1117/12.300637
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 9 (20 February 1998); doi: 10.1117/12.300648
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 15 (20 February 1998); doi: 10.1117/12.300659
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 21 (20 February 1998); doi: 10.1117/12.300670
Structure of Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 32 (20 February 1998); doi: 10.1117/12.300681
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 37 (20 February 1998); doi: 10.1117/12.300692
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 42 (20 February 1998); doi: 10.1117/12.300703
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 47 (20 February 1998); doi: 10.1117/12.300714
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 54 (20 February 1998); doi: 10.1117/12.300725
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 56 (20 February 1998); doi: 10.1117/12.300638
Application of Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 62 (20 February 1998); doi: 10.1117/12.300639
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 70 (20 February 1998); doi: 10.1117/12.300640
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 77 (20 February 1998); doi: 10.1117/12.300641
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 82 (20 February 1998); doi: 10.1117/12.300642
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 86 (20 February 1998); doi: 10.1117/12.300643
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 90 (20 February 1998); doi: 10.1117/12.300644
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 94 (20 February 1998); doi: 10.1117/12.300645
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 98 (20 February 1998); doi: 10.1117/12.300646
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 104 (20 February 1998); doi: 10.1117/12.300647
Optical and Nonlinear Properties
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 110 (20 February 1998); doi: 10.1117/12.300649
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 121 (20 February 1998); doi: 10.1117/12.300650
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 125 (20 February 1998); doi: 10.1117/12.300651
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 130 (20 February 1998); doi: 10.1117/12.300652
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 133 (20 February 1998); doi: 10.1117/12.300653
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 137 (20 February 1998); doi: 10.1117/12.300654
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 142 (20 February 1998); doi: 10.1117/12.300655
Superlattice, Interface, and Surface
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 148 (20 February 1998); doi: 10.1117/12.300656
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 157 (20 February 1998); doi: 10.1117/12.300657
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 161 (20 February 1998); doi: 10.1117/12.300658
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 166 (20 February 1998); doi: 10.1117/12.300660
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 171 (20 February 1998); doi: 10.1117/12.300661
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 175 (20 February 1998); doi: 10.1117/12.300662
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 180 (20 February 1998); doi: 10.1117/12.300663
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 183 (20 February 1998); doi: 10.1117/12.300664
Superconductor and Diamondlike Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 188 (20 February 1998); doi: 10.1117/12.300665
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 192 (20 February 1998); doi: 10.1117/12.300666
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 205 (20 February 1998); doi: 10.1117/12.300669
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 210 (20 February 1998); doi: 10.1117/12.300671
Preparation of Films I
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 216 (20 February 1998); doi: 10.1117/12.300672
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 221 (20 February 1998); doi: 10.1117/12.300673
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 227 (20 February 1998); doi: 10.1117/12.300674
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 235 (20 February 1998); doi: 10.1117/12.300676
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 244 (20 February 1998); doi: 10.1117/12.300678
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 247 (20 February 1998); doi: 10.1117/12.300679
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 251 (20 February 1998); doi: 10.1117/12.300680
Properties of Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 256 (20 February 1998); doi: 10.1117/12.300682
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 262 (20 February 1998); doi: 10.1117/12.300683
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 269 (20 February 1998); doi: 10.1117/12.300684
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 274 (20 February 1998); doi: 10.1117/12.300685
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 280 (20 February 1998); doi: 10.1117/12.300686
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 306 (20 February 1998); doi: 10.1117/12.300693
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 310 (20 February 1998); doi: 10.1117/12.300694
Ferroelectric and Dielectric Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 322 (20 February 1998); doi: 10.1117/12.300695
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 328 (20 February 1998); doi: 10.1117/12.300696
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 336 (20 February 1998); doi: 10.1117/12.300698
Preparation of Films II
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 342 (20 February 1998); doi: 10.1117/12.300699
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 347 (20 February 1998); doi: 10.1117/12.300700
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 352 (20 February 1998); doi: 10.1117/12.300701
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 356 (20 February 1998); doi: 10.1117/12.300702
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 361 (20 February 1998); doi: 10.1117/12.300704
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 366 (20 February 1998); doi: 10.1117/12.300705
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 371 (20 February 1998); doi: 10.1117/12.300706
Properties and Measurement
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 378 (20 February 1998); doi: 10.1117/12.300707
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 381 (20 February 1998); doi: 10.1117/12.300708
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 386 (20 February 1998); doi: 10.1117/12.300709
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 391 (20 February 1998); doi: 10.1117/12.300710
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 395 (20 February 1998); doi: 10.1117/12.300711
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 399 (20 February 1998); doi: 10.1117/12.300712
Semiconductor Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 404 (20 February 1998); doi: 10.1117/12.300713
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 408 (20 February 1998); doi: 10.1117/12.300715
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 412 (20 February 1998); doi: 10.1117/12.300716
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 415 (20 February 1998); doi: 10.1117/12.300717
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 419 (20 February 1998); doi: 10.1117/12.300718
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 422 (20 February 1998); doi: 10.1117/12.300719
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 426 (20 February 1998); doi: 10.1117/12.300720
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 429 (20 February 1998); doi: 10.1117/12.300721
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 433 (20 February 1998); doi: 10.1117/12.300722
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 436 (20 February 1998); doi: 10.1117/12.300723
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 440 (20 February 1998); doi: 10.1117/12.300724
Properties and Preparation
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 446 (20 February 1998); doi: 10.1117/12.300726
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Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 460 (20 February 1998); doi: 10.1117/12.300729
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 465 (20 February 1998); doi: 10.1117/12.300730
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 470 (20 February 1998); doi: 10.1117/12.300731
Ferroelectric and Dielectric Films
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, pg 316 (20 February 1998); doi: 10.1117/12.300732
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