Paper
20 February 1998 Giant magnetoresistance effect in granular-type Co-Ag/Ag multilayers
Rong Jun Zhang, Liang-Yao Chen, Shi-Ming Zhou, Yu Wang, Bo Xu, Dong-Liang Qian, Wei-Ming Zheng, Yu-Xiang Zheng
Author Affiliations +
Proceedings Volume 3175, Third International Conference on Thin Film Physics and Applications; (1998) https://doi.org/10.1117/12.300729
Event: Third International Conference on Thin Film Physics and Applications, 1997, Shanghai, China
Abstract
For the granular type of Co-Ag (1.8 nm)/Ag multilayers with the Co contents of 22, 45, and 65 at%, the magneto-resistance ratio ((Delta) R/R) has a maximum found with respect to the AG spacer layer thickness. It is found that with increasing Co content the (Delta) R/R peak shifts towards thicker AG layers. For the Co-Ag/Ag multilayers with low Co contents, (Delta) R/R increases monotonically with increasing magnetic layer thickness, but has a maximum near the magnetic layer thickness of 2.2 nm for the sample having a higher Co content. The peak is thought as a result of the antiferromagnetic (AFM) coupling between the nearest Co clusters in neighboring magnetic layers. In the high field region, the magnetization and the square root of (Delta) R/R vary as a linear function of the reciprocal applied field for all multilayers. In the low field range, they are proportional to the applied field for samples with thin magnetic layers.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rong Jun Zhang, Liang-Yao Chen, Shi-Ming Zhou, Yu Wang, Bo Xu, Dong-Liang Qian, Wei-Ming Zheng, and Yu-Xiang Zheng "Giant magnetoresistance effect in granular-type Co-Ag/Ag multilayers", Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); https://doi.org/10.1117/12.300729
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KEYWORDS
Magnetism

Silver

Atomic force microscopy

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