20 February 1998 Infrared properties of lithium-intercalated vanadium pentoxide films
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Proceedings Volume 3175, Third International Conference on Thin Film Physics and Applications; (1998); doi: 10.1117/12.300708
Event: Third International Conference on Thin Film Physics and Applications, 1997, Shanghai, China
Abstract
Vanadium pentoxide films were prepared by evaporation followed by annealing post-treatment in O2 atmosphere. Lithium was inserted electrochemically from an electrolyde into vanadium pentoxide films so that LixV2O5 was formed. The structure of the post-treated samples was determined by XRD and infrared reflectance was measured by FTIR for as-grown and lithiated films, respectively. The experimental results have shown that V2O5 thin films have some infrared absorption peaks located at 982, 824, 527 and 504 cm-1, and the infrared vibration bands corresponding to the peaks have a good agreement with the analysis by Abello et al. for polycrystalline V2O5, and there is an obvious influence of lithium insertion on the infrared vibration properties which may be reconciled with the lattice change such as expansion and contraction.
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Guangming Wu, Yonggang Wu, Xingyuan Ni, Zhen Zhou, Huiqin Zhang, Zhemin Jin, Xiang Wu, "Infrared properties of lithium-intercalated vanadium pentoxide films", Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300708; https://doi.org/10.1117/12.300708
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KEYWORDS
Vanadium

Infrared radiation

Lithium

Absorption

Annealing

FT-IR spectroscopy

Reflectivity

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