Paper
20 February 1998 PL study of QDs manufactured by visible light lithography and wet etching
Xingquan Liu, Mingfang Wan, Bo Zhang, Xiaoshuang Chen, Wei Lu, Shuechu Shen
Author Affiliations +
Proceedings Volume 3175, Third International Conference on Thin Film Physics and Applications; (1998) https://doi.org/10.1117/12.300716
Event: Third International Conference on Thin Film Physics and Applications, 1997, Shanghai, China
Abstract
Manufacture of AlGaAs/GaAs QDs by visible light lithography and etching is accomplished in this paper, and the size distribution is studied by smaill-spotted PL. The broadening of PL peaks which is caused by the fluctuation of quantum well is studied.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xingquan Liu, Mingfang Wan, Bo Zhang, Xiaoshuang Chen, Wei Lu, and Shuechu Shen "PL study of QDs manufactured by visible light lithography and wet etching", Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); https://doi.org/10.1117/12.300716
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KEYWORDS
Lithography

Manufacturing

Visible radiation

Wet etching

Etching

Quantum wells

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