Ho3+ ions emitting in the near IR range, can be sensitized either by Tm3+ or by Cr4+ ions, as energy resonances between these ions are possible. In the Cs2Al2SiO7 (CAS) host, the shortest distance between two RI3+ cations is 3.56 angstrom while this distance could be reduced to 3.14 angstrom when Cr4+ and RE3+ ions are considered. In this study, the materials are prepared in the form of small single crystal by the melting zone process in order to perform spectroscopic investigation. In the CAS host, the energy transfer processes are in competition with the very efficient non radiative multiphonon relaxation. Strong Tm yields Ho energy transfer enhanced the Ho3+ near IR emission around 2 micrometers while the Ho yields Tm back transfer probability is quite low. For Cr4+:CAS, due to a strong electron-phonon coupling, Cr4+ emission suffers from strong thermal quenching and almost vanished at room temperature. In the Cr4+:RE3+:Ca2Al2SiO7 crystals, interactions between Cr4+ and Er3+, Ho3+ or Tm3+ occur and lifetime measurements are used to quantify the energy transfers probabilities.
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