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14 July 1997 Morphologic defects in Cr3+:LiCaAlF6 crystals grown by the Czochralski method
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Proceedings Volume 3178, Solid State Crystals: Growth and Characterization; (1997)
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland
The paper reports on the growth of Cr3+:LiCaAlF6 single crystals by the Czochralski method from a stoichiometric melt of LiF, CaF2, and AlF3. (Cr3+ doping was obtained by the replacement of about 3 Mol-% AlF3 by the corresponding quantity CrF3.) Only the peripheric region and the neck of the crystals have high optical quality, whereas scattering 'needles' of typically 5 multiplied by 5 multiplied by 35 micrometers cubed can be observed in the top region and very small particles very much less than 1 micrometer ('dust') can be observed in the bottom part of the crystals. By EDX element analysis performed after ion beam thinning of the samples the needles were determined to have an excess Ca content in comparison to the LiCaAlF6 matrix. The binary compound LiAlF4 has the highest vapor pressure in the ternary system LiF - CaF2 - AlF3. It can be concluded, that LiAlF4 evaporates continuously during crystal growth, leaving in the melt CaF2 in excess. The incongruently melting compound Ca2AlF7 is considered to be the most probable candidate for the observed scattering centers.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Klimm, K. Seiranian, Peter Reiche, A. Polity, and R. Krause-Rehberg "Morphologic defects in Cr3+:LiCaAlF6 crystals grown by the Czochralski method", Proc. SPIE 3178, Solid State Crystals: Growth and Characterization, (14 July 1997);


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