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13 June 1997 Determination of the activation energy of electron traps with fractional glow technique
A. Opanowicz, Piotr Pietrucha
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Proceedings Volume 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology; (1997) https://doi.org/10.1117/12.276244
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland
Abstract
The fractional glow technique (FGT) developed by Gobrecht and Hofmann for determination of trap energy distribution in an insulating crystal is examined. The fractional thermoluminescence (TL) curves are generated by numerical solutions of the basic kinetic equations describing an insulator model with two kinds of interactive electron traps. The results show that two different activation energies of traps are resolved with the FGT when the corresponding individual TL peaks are not strongly overlapped.
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A. Opanowicz and Piotr Pietrucha "Determination of the activation energy of electron traps with fractional glow technique", Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); https://doi.org/10.1117/12.276244
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KEYWORDS
Crystals
Numerical analysis
Thermal modeling
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