13 June 1997 X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals
Author Affiliations +
Proceedings Volume 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology; (1997) https://doi.org/10.1117/12.276221
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland
Abstract
Precise lattice parameters of stoichiometric TiN, TiC and Ti(N,C) solid solutions whiskers and needle-like crystals have been determined using the Bond's method. Temperature measurement of lattice parameters in the range 290-600 K have been performed and thermal expansion coefficients (alpha) have been determined. A non-linear change of coefficients (alpha) with the composition has been found. The observed decrease of (alpha) values for solid solutions crystals was related to the character of chemical bonds.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Krystyna Wokulska, "X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals", Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); doi: 10.1117/12.276221; https://doi.org/10.1117/12.276221
PROCEEDINGS
4 PAGES


SHARE
Back to Top