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18 August 1997 Linear pattern identification system
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Proceedings Volume 3185, Automatic Inspection and Novel Instrumentation; (1997) https://doi.org/10.1117/12.284037
Event: ISMA '97 International Symposium on Microelectronics and Assembly, 1997, Singapore, Singapore
Abstract
A novel solution for image pattern identification based on the description of linear structure is proposed. The concept is currently applied to the classification of documents such as business forms and logos. The geometric layout of objects such as lines, text and spacing is converted to a 1D string representation. A novel, generic and quantized string format is proposed for the system. Very encouraging results have been obtained and the technique can be used for a wide range of applications and extended to handle patterns including electronic circuit diagrams without obvious linear features. The use of strings facilities quick and robust measures of similarity between two patterns and a quantifiable tolerance of segmentation inconsistencies is possible. In addition, no training is required.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antoine Ting and Maylor K. H. Leung "Linear pattern identification system", Proc. SPIE 3185, Automatic Inspection and Novel Instrumentation, (18 August 1997); https://doi.org/10.1117/12.284037
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