Sensitivity And Resolution Criteria For Infrared Cameras With Array Detectors And Analysis For High Speed Computation Requirements

H. Prem; G. W. Stroke; J. P. Fouilloy

doi:10.1117/12.933172

4 August 1982 Sensitivity And Resolution Criteria For Infrared Cameras With Array Detectors And Analysis For High Speed Computation Requirements

H. Prem, G. W. Stroke, J. P. Fouilloy

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Proceedings Volume 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications; (1982) https://doi.org/10.1117/12.933172
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

The recent availability of high-performance infrared imaging systems of different types and designs has revealed certain difficulties in correlating practical "field-test" performance with the widely used "MRTD" (minimum resolvable temperature difference) values in the form developed during the early period of the IR imaging activities since 1955. This applies in particular also to systems using mosaic array detectors of both the "scanning" and the "staring" types. Such difficulties may be satisfactorily surmounted by uncoupling "sensitivity" and "resolution" performance parameters. The basic theory will be presented together with practical examples for representative systems and comparison with "MRTD" curves, which remain useful for noise-level characterisation. The imaging performance analysis is necessary also for an assessment of adequate sensitivity and resolution in a variety of pattern-recognition applications and of computer-speed requirements in the use of IR "smart sensor" systems. A basic theoretical analysis (to be introduced) shows that VSHIC computer systems (with computational speeds at least some loo times greater than from presently available computers) would be required for representative real-time use of IR sensors in the most demanding applications.

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H. Prem, G. W. Stroke, and J. P. Fouilloy "Sensitivity And Resolution Criteria For Infrared Cameras With Array Detectors And Analysis For High Speed Computation Requirements", Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); https://doi.org/10.1117/12.933172

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KEYWORDS

Imaging systems

Infrared imaging

Sensors

Infrared sensors

Minimum resolvable temperature difference

Thermography

Image resolution

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