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29 December 1997 Simultaneous measurement of dispersion, spectrum, and distance with a Fourier transform spectrometer
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Abstract
A Fourier transform spectrometer is used to simultaneously measure thickness, dispersion and absorption spectrum of a sample. It is shown that short coherence interferometry has the potential to measure the three dimensional distribution of the structure, the spectral absorption and dispersion of a sample.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas Hellmuth and M. Welle "Simultaneous measurement of dispersion, spectrum, and distance with a Fourier transform spectrometer", Proc. SPIE 3197, Optical Biopsies and Microscopic Techniques II, (29 December 1997); https://doi.org/10.1117/12.297973
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