2 January 1998 Absolute sapphire optical fiber sensor for high-temperature applications
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Proceedings Volume 3201, Sensors and Controls for Advanced Manufacturing; (1998) https://doi.org/10.1117/12.298022
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States
Abstract
This paper describes sapphire fiber-based EFPI sensors incorporated with wavelength scanning absolute signal demodulation. Silica-based optical fiber extrinsic Fabry- Perot interferometric (EFPI) sensors have been very successfully used in measuring a wide range of physical and chemical parameters. However, these fibers can only sustain temperatures of 800 degrees C because of germanium thermal diffusion affecting both the attenuation and waveguide multi-mode properties of the fiber. Since sapphire has a melting point above 2000 degrees C, sapphire optical fiber can be potentially used up to 2000 degrees C in an EFPI scheme. We obtain a resolution of 0.02 micrometers with a dynamic range of 27 micrometers for micro-displacement measurement.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hai Xiao, Wei Zhao, Robert Lockhart, Jun Wang, Anbo Wang, "Absolute sapphire optical fiber sensor for high-temperature applications", Proc. SPIE 3201, Sensors and Controls for Advanced Manufacturing, (2 January 1998); doi: 10.1117/12.298022; https://doi.org/10.1117/12.298022
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