10 December 1997 Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique
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Proceedings Volume 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III; (1997) https://doi.org/10.1117/12.294443
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States
Abstract
A structured-lighting reflection technique was developed in order to detect and measure small wavinesses and curvature defects on specular free-form surfaces. It can reconstruct the 3D relief of specular free-form surfaces and display the curvature at each point. A calibrated camera observes the reflection of a retro-illuminated LCD panel through the free- form surface. The use of a coded lighting technique and the knowledge of the setup geometry allow to locate each observed point on the LCD panel. Using the principle of inverse ray tracing, a surface modelled with Bezier polynomials is fitted to the observed data. Unlike structured-lighting projection techniques which are directly sensitive to the topography of the surface to be inspected, the structured-lighting reflection techniques are essentially sensitive to the gradient and thus enable the detection and measurement of curvature defects which are imperceptible using the projection techniques.
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Denis Perard, Juergen Beyerer, "Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique", Proc. SPIE 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December 1997); doi: 10.1117/12.294443; https://doi.org/10.1117/12.294443
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