26 September 1997 Real-time robust line detection in microscopy images
Author Affiliations +
We discuss an algorithm to detect lines in low contrast images in the presence of noise. The image we consider are orientation imaging microscopy (OIM) images of metal surfaces. The objective is to locate lines (boundaries between grains) in the OIM images and use that information to determine where three grains intersect (triple junctions). We use a novel method for fusion edge enhancement and a new fast skeletonization procedure using a new and efficient hit and miss transform (HMT) that produces lines of one pixel width.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashit Talukder, Ashit Talukder, David P. Casasent, David P. Casasent, } "Real-time robust line detection in microscopy images", Proc. SPIE 3208, Intelligent Robots and Computer Vision XVI: Algorithms, Techniques, Active Vision, and Materials Handling, (26 September 1997); doi: 10.1117/12.290321; https://doi.org/10.1117/12.290321


Back to Top