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27 August 1997 Strained Si NMOSFET on relaxed Si1-xGex formed by ion implantation of Ge
Soji John; Samit K. Ray; Sandeep K. Oswal; Sanjay K. Banerjee
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Proceedings Volume 3212, Microelectronic Device Technology; (1997) https://doi.org/10.1117/12.284584
Event: Microelectronic Manufacturing, 1997, Austin, TX, United States
Abstract
Strained-Si films show considerably higher electron mobility than conventional silicon films which results in increased transconductance and drive current of strained-Si channel NMOSFETs. However, in order to form tensile strained silicon it is necessary to use relaxed Si1-xGex 'substrates,' typically requiring the growth of several microns of a graded Si1-xGex layer, followed by a buffer layer. In this work, we have used ion implantation of Ge followed by high- temperature annealing to form a relaxed substrate, eliminating the growth of graded, relaxed layers, and simplifying the fabrication process. Upon this film, a 1000 angstrom buffer layer of Si0.85Ge0.15 was grown. X-ray analysis indicates that the films formed by this method are 75% relaxed. This was followed by a 200 angstrom thick strained-Si layer. For comparison, unstrained Si epitaxial films and a 2000 angstrom thick film of Si0.85Ge0.15 (on unimplanted Si) followed by 200 angstrom of Si were used. A typical self-aligned MOS process with modifications to achieve low-thermal budget was used to fabricate NMOSFETs with gate lengths ranging from 10 micrometer to 0.8 micrometer. Strained-Si devices show a 17.5% higher peak linear gm than control devices as a result of higher electron mobility in the strained-Si channel.
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Soji John, Samit K. Ray, Sandeep K. Oswal, and Sanjay K. Banerjee "Strained Si NMOSFET on relaxed Si1-xGex formed by ion implantation of Ge", Proc. SPIE 3212, Microelectronic Device Technology, (27 August 1997); https://doi.org/10.1117/12.284584
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