Paper
23 April 1982 Picosecond Laser Damage Mechanisms At Semiconductor Surfaces
M. F. Becker, R. M. Walser, Y. K. Jhee, D. Y. Sheng
Author Affiliations +
Proceedings Volume 0322, Picosecond Lasers and Applications; (1982) https://doi.org/10.1117/12.933214
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States
Abstract
We treat picosecond laser induced damage as a non-equilibrium phase transition and propose a new damage mechanism. This model which includes energy transfer by resonant surface plasmons on small electron density droplets is shown to be consistent with existing experimental data. New experimental data has been taken which demonstrates the nucleation and growth aspects of the laser damage process.
© (1982) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. F. Becker, R. M. Walser, Y. K. Jhee, and D. Y. Sheng "Picosecond Laser Damage Mechanisms At Semiconductor Surfaces", Proc. SPIE 0322, Picosecond Lasers and Applications, (23 April 1982); https://doi.org/10.1117/12.933214
Lens.org Logo
CITATIONS
Cited by 14 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Electronics

Picosecond phenomena

Absorption

Laser induced damage

Surface plasmons

Liquids

Back to Top