20 October 1997 Measurements of spatial distribution of the main parameters of polarizing devices
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Proceedings Volume 3238, Current Ukrainian Research in Optics and Photonics: Optoelectronic and Hybrid Optical/Digital Systems for Image Processing; (1997); doi: 10.1117/12.284801
Event: Optoelectronic and Hybrid Optical/Digital Systems for Image Processing, 1997, none, Ukraine
Abstract
In optical systems for information processing based on spatial light modulators, the polarization components are widely used. Those components should provide a homogeneous polarization state over all their aperture. At the same time, numerous studies have revealed that there exists a large spatial scattering of the parameters of these elements. Determination of the quality of polarizers with the aid of polarimeter is known to be one of the most acceptable methods. One of the possible ways for solving this problem is just suggested here. Its advantage is that imperfections of polarizers which ensure creation and analysis of polarized light do not influence the values of parameters for testing polarizers.
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Yaroslav I. Shopa, Modest O. Kravchuk, L. P. Lutsiv-Shumski, "Measurements of spatial distribution of the main parameters of polarizing devices", Proc. SPIE 3238, Current Ukrainian Research in Optics and Photonics: Optoelectronic and Hybrid Optical/Digital Systems for Image Processing, (20 October 1997); doi: 10.1117/12.284801; https://doi.org/10.1117/12.284801
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KEYWORDS
Polarizers

Measurement devices

Polarization

Data processing

Light scattering

Polarimetry

Scattering

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