26 September 1997 Spectroscopy of ultrathin resonant films at total external reflection of Moessbauer and synchrotron radiation
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Proceedings Volume 3239, Photon Echo and Coherent Spectroscopy; (1997) https://doi.org/10.1117/12.287714
Event: PECS '97: Photon Echo and Coherent Spectroscopy, 1997, Yoshkar-Ola, Russian Federation
Abstract
Total external reflection effect improves the depth sensitivity of Mossbauer spectroscopy up to 1 - 5 nm. At grazing angles of incidence of collimated radiation from radioactive source on resonant film it is possible to measure simultaneously the intensity of the specularly reflected wave and the secondary radiation emission (e.g. conversion electrons) as a function of energy shift (Mossbauer spectra). Variations of grazing angle in vicinity of the critical one of total external reflection (1 - 6 mrad) allow to determine the hyperfine interactions distribution over depth in resonant film. We present the results of such investigation for 57Fe/Sc/57Fe and oxidized 57Fe films and briefly describe the main problems appearing in the course of interpretation of Mossbauer spectra in this geometry. The usage of pulsed synchrotron radiation instead of the radioactive sources has essential advantages: (1) it has quite good natural collimation (approximately 10 (mu) rad) and (2) it opens a new way for nuclear resonant scattering investigation -- in time scale. The example of interpretation of time spectra of resonantly reflected beam from oxidized 57Fe film is done.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. A. Andreeva, V. N. Gittsovich, S. M. Irkaev, V. G. Semenov, "Spectroscopy of ultrathin resonant films at total external reflection of Moessbauer and synchrotron radiation", Proc. SPIE 3239, Photon Echo and Coherent Spectroscopy, (26 September 1997); doi: 10.1117/12.287714; https://doi.org/10.1117/12.287714
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