1 March 1998 X-ray microscopy with compact pulsed sources
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Proceedings Volume 3240, 26th AIPR Workshop: Exploiting New Image Sources and Sensors; (1998) https://doi.org/10.1117/12.300073
Event: 26th AIPR Workshop: Exploiting New Image Sources and Sensors, 1997, Washington, DC, United States
Abstract
X-ray microscopy inherently possesses characteristics complementary to optical and electron microscopy. Short wavelength x-ray radiation, especially in the so-called 'water window', permits a twenty-fold improvement in spatial resolution over optical microscopy while preserving a depth of field large enough to image whole biological specimens int heir natural state. Whereas electron microscopy can access atomic-scale resolution,this can only be applied to biological and medical specimens at the expense of detrimental preparation procedures that preclude real-time analysis of structural changes in living organisms. We describe progress being made in an x-ray imaging technology that provides high-resolution single frame x-ray images of in-vitro specimens captured in a time sufficiently short that any radiation damage mechanisms to the structure are not recorded. Several different biology and medical research groups find this type of microscopy particularly well-suited to the detailed analysis of sub-cellular features, and to the study of live organisms subjected to various forms of external stimuli. This technology utilizes bright x-ray sources produced by compact pulse laser systems. The incorporation of advanced x-ray optical and electron-optical systems will lead to the development of a compact, real-time x-ray microscope, having a broad range of applications.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin C. Richardson, Martin C. Richardson, Masataka Kado, Masataka Kado, David Scott Torres, David Scott Torres, Yoshimasa Yamamoto, Yoshimasa Yamamoto, Herman Friedman, Herman Friedman, Jayshree Rajyaguru, Jayshree Rajyaguru, Michael J. Muszynski, Michael J. Muszynski, } "X-ray microscopy with compact pulsed sources", Proc. SPIE 3240, 26th AIPR Workshop: Exploiting New Image Sources and Sensors, (1 March 1998); doi: 10.1117/12.300073; https://doi.org/10.1117/12.300073
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