Optical probes as tools for the investigation of aging properties of high-power laser diode arrays

Jens Wolfgang Tomm; A. Baerwolff; Roland Puchert; A. Jaeger; Thomas Elsaesser

doi:10.1117/12.307028

20 April 1998 Optical probes as tools for the investigation of aging properties of high-power laser diode arrays

Jens Wolfgang Tomm, A. Baerwolff, Roland Puchert, A. Jaeger, Thomas Elsaesser

Proceedings Volume 3244, Laser-Induced Damage in Optical Materials: 1997; (1998) https://doi.org/10.1117/12.307028
Event: Laser-Induced Damage in Optical Materials: 1997, 1997, Boulder, CO, United States

Abstract

Optical probes are used for the investigation of aging properties of high-power laser diode arrays. Two methods - micro-Raman and laser beam induced current (LBIC) scans are discussed: Micro-Raman spectroscopy - a laboratory based method - was applied in order to investigate facet temperature distributions for fresh and aged high-power laser diode arrays (LDA) under regular operation conditions. Furthermore, facet temperatures were measured for operation close to the catastrophic optical damage (COD) level.For these experimental situation facet temperatures of more than 600 degrees C were obtained. In order to conclude from pure temperature data to the thermal management of the LDA we performed modeling work based on the finite element method. Close to the COD up to 14 percent of the total thermal load of the LDA is concentrated to a very thin region close to the facet. Photocurrent spectra and LBIC were found to indicate aging induced effects such as defect creation as well as strain effects. LBIC - method which also could be used as test method for fabrication processes - allows to map aging induced changes of defect distributions in LDAs. Furthermore, the potential of LBIC as quick strain inspection method is discussed.

Citation Download Citation

Jens Wolfgang Tomm, A. Baerwolff, Roland Puchert, A. Jaeger, and Thomas Elsaesser "Optical probes as tools for the investigation of aging properties of high-power laser diode arrays", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); https://doi.org/10.1117/12.307028

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available