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20 April 1998 Photothermal approach to local heating imaging: application to laser degradation
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We use various probes to measure local temperature induced by internal or external heating of active or passive devices: Mirage detection can reveal heating of few ppb of the input power, whereas photothermal microscopy provides sub-micron spatial resolution. Temperature distribution is measured through periodic deflection or reflectivity mapping at frequencies high enough to confine heating near the source. Scanning InGaAsP/InP lasers facets, shows the weak influence of nonradiative recombination, in agreement with the high output power of these lasers before degradation. On strained-layer InGaAs quantum well lasers we obtained a drastic temperature rise, that we explain through simple model based on line heating for the laser cavity and point heating located at the facet. On a damaged laser the result, demonstrate clearly the existence of heating zones far from the facet along the laser cavity.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Cherrak, Vincent Loriette, Benoit Claude Forget, Jean Paul Roger, D. Fournier, and Albert Claude Boccara "Photothermal approach to local heating imaging: application to laser degradation", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998);

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