20 April 1998 Photothermal approach to local heating imaging: application to laser degradation
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Abstract
We use various probes to measure local temperature induced by internal or external heating of active or passive devices: Mirage detection can reveal heating of few ppb of the input power, whereas photothermal microscopy provides sub-micron spatial resolution. Temperature distribution is measured through periodic deflection or reflectivity mapping at frequencies high enough to confine heating near the source. Scanning InGaAsP/InP lasers facets, shows the weak influence of nonradiative recombination, in agreement with the high output power of these lasers before degradation. On strained-layer InGaAs quantum well lasers we obtained a drastic temperature rise, that we explain through simple model based on line heating for the laser cavity and point heating located at the facet. On a damaged laser the result, demonstrate clearly the existence of heating zones far from the facet along the laser cavity.
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R. Cherrak, R. Cherrak, Vincent Loriette, Vincent Loriette, Benoit Claude Forget, Benoit Claude Forget, Jean Paul Roger, Jean Paul Roger, D. Fournier, D. Fournier, Albert Claude Boccara, Albert Claude Boccara, } "Photothermal approach to local heating imaging: application to laser degradation", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307026; https://doi.org/10.1117/12.307026
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