20 April 1998 Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation
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Abstract
We present new improvements that were achieved at LOSCM Marseilles for a better characterization of optical thin films. Roughness-induced absorption, angular ellipsometry of light scattering and multidielectric resonances are discussed in multilayers. Theoretical and experimental results are given and new applications are emphasized.
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Claude Amra, Claude Amra, Sophie Maure, Sophie Maure, Carole Deumie, Carole Deumie, Hugues Giovannini, Hugues Giovannini, Jean-Yves Natoli, Jean-Yves Natoli, } "Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.306971; https://doi.org/10.1117/12.306971
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