Waveguide losses by photothermal techniques in multilayers for laser damage investigation

M. Ranier; Patricia Volto; Gerard Albrand; Jean-Yves Natoli; Claude Amra; B. Pinot; Bernard Geenen

doi:10.1117/12.306970

20 April 1998 Waveguide losses by photothermal techniques in multilayers for laser damage investigation

M. Ranier, Patricia Volto, Gerard Albrand, Jean-Yves Natoli, Claude Amra, B. Pinot, Bernard Geenen

Proceedings Volume 3244, Laser-Induced Damage in Optical Materials: 1997; (1998) https://doi.org/10.1117/12.306970
Event: Laser-Induced Damage in Optical Materials: 1997, 1997, Boulder, CO, United States

Abstract

Accurate characterization of losses in optical multilayers remains critical for laser damage investigation. In particular, due to time deposition and shift of deposition parameters, materials within multilayers have different intrinsic properties according to their vertical location within the stack. For this reason, different extinction coefficients can be found for materials in single layer forms and materials confined in multilayers. Therefore a non- destructive probe is required that should permit to characterize separately each interface or each bulk of a multilayer. This probe is offered by guided wave and photothermal techniques that we present in this paper. Our technique allows us to measure loss anomalies in multilayer waveguides by recording an attenuation coefficient for each propagation mode, as well as a temperature distribution perpendicular to the mode direction. The results are analyzed to determine dissipate properties versus z-location within the stacks. At this step an attempt is made to correlate damage with loss anomalies.

Citation Download Citation

M. Ranier, Patricia Volto, Gerard Albrand, Jean-Yves Natoli, Claude Amra, B. Pinot, and Bernard Geenen "Waveguide losses by photothermal techniques in multilayers for laser damage investigation", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); https://doi.org/10.1117/12.306970

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