1 May 1998 Nonlocal approach to membrane stability under electrical stress
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Proceedings Volume 3253, Biomedical Sensing and Imaging Technologies; (1998); doi: 10.1117/12.308039
Event: BiOS '98 International Biomedical Optics Symposium, 1998, San Jose, CA, United States
Abstract
Existing models of membrane instability and breakdown under an applied voltage are critically examined. An alternative, speculative treatment of the electroelastic model is suggested, based on the assumption that spatial dispersion of the elastic moduli leads to their effective softening at short wave lengths. The model parameters describing this effect chosen to satisfy the condition that softening of the 'peristaltic' mode due to an applied voltage of 1 to 1.5 V leads to instability and breakdown. With these parameters we calculate the stretching diagram of the membrane and show that it agrees with existing measurements.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael B. Partenskii, Vladimir L. Dorman, Peter C. Jordan, "Nonlocal approach to membrane stability under electrical stress", Proc. SPIE 3253, Biomedical Sensing and Imaging Technologies, (1 May 1998); doi: 10.1117/12.308039; http://dx.doi.org/10.1117/12.308039
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KEYWORDS
Molecules

Dielectrics

Interfaces

Electrostriction

Capacitance

Capacitors

Picosecond phenomena

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