9 June 1998 Improved optical method for measurement of AFM cantilever deflection
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Proceedings Volume 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V; (1998) https://doi.org/10.1117/12.310552
Event: BiOS '98 International Biomedical Optics Symposium, 1998, San Jose, CA, United States
Abstract
In our lab we have developed an atomic force microscope (AFM) for biological and technical applications with improved optical method for measuring of cantilever with an additional lens placed between cantilever and four-segment photodiode. The lens forms an image of the cantilever in the photodiode plane. Small sizes of the cantilever image improve the resolution of AFM and reduce the requirements to the optical scheme of the microscope. The lens nonlinear transmission of the cantilever deflection is compensated by means of computer program. With the AFM were imaged the DNA of plague microbes and phages of plague and V. Cholera.
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Vil B. Baiburin, Nikolai P. Konnov, Yuri P. Volkov, "Improved optical method for measurement of AFM cantilever deflection", Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, (9 June 1998); doi: 10.1117/12.310552; https://doi.org/10.1117/12.310552
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