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9 June 1998 Microscopy using an interference pattern as illumination source
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Proceedings Volume 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V; (1998) https://doi.org/10.1117/12.310568
Event: BiOS '98 International Biomedical Optics Symposium, 1998, San Jose, CA, United States
Abstract
We describe a method of obtaining optically scanned fluorescence images in a widefield conventional microscope by interfering two beams on an object so as to illuminate it with a single spatial frequency fringe pattern. Images taken at three spatial positions of the fringe pattern are processed in real time to produce optically sectioned images which are substantially similar to those obtained with confocal microscopes.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rimas Juskaitis, Mark A. A. Neil, and Tony Wilson "Microscopy using an interference pattern as illumination source", Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, (9 June 1998); https://doi.org/10.1117/12.310568
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