New directions in surface spectroscopy enabled by ultrafast lasers

P. T. Wilson; Yun-Shik Lee; Y. Jiang; D. Lim; R. Kempf; R. Bungener; X. F. Hu; Jerry I. Dadap Jr.; Mark H. Anderson; M. ter Beek; Z. Xu; N. M. Russell; John G. Ekerdt; P. S. Parkinson; E. D. Mishina; Oleg A. Aktsipetrov; Michael C. Downer

doi:10.1117/12.307114

30 April 1998 New directions in surface spectroscopy enabled by ultrafast lasers

P. T. Wilson, Yun-Shik Lee, Y. Jiang, D. Lim, R. Kempf, R. Bungener, X. F. Hu, Jerry I. Dadap Jr., Mark H. Anderson, M. ter Beek, Z. Xu, N. M. Russell, John G. Ekerdt, P. S. Parkinson, E. D. Mishina, Oleg A. Aktsipetrov, Michael C. Downer

Author Affiliations +

Proceedings Volume 3272, Laser Techniques for Surface Science III; (1998) https://doi.org/10.1117/12.307114
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

Solid state femtosecond lasers enable powerful new nonlinear optical spectroscopic characterization techniques for technologically relevant Column IV and III-V semiconductor interfaces and growth surfaces.

Citation Download Citation

P. T. Wilson, Yun-Shik Lee, Y. Jiang, D. Lim, R. Kempf, R. Bungener, X. F. Hu, Jerry I. Dadap Jr., Mark H. Anderson, M. ter Beek, Z. Xu, N. M. Russell, John G. Ekerdt, P. S. Parkinson, E. D. Mishina, Oleg A. Aktsipetrov, and Michael C. Downer "New directions in surface spectroscopy enabled by ultrafast lasers", Proc. SPIE 3272, Laser Techniques for Surface Science III, (30 April 1998); https://doi.org/10.1117/12.307114

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