30 April 1998 New directions in surface spectroscopy enabled by ultrafast lasers
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Abstract
Solid state femtosecond lasers enable powerful new nonlinear optical spectroscopic characterization techniques for technologically relevant Column IV and III-V semiconductor interfaces and growth surfaces.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. T. Wilson, P. T. Wilson, Yun-Shik Lee, Yun-Shik Lee, Y. Jiang, Y. Jiang, D. Lim, D. Lim, R. Kempf, R. Kempf, R. Bungener, R. Bungener, X. F. Hu, X. F. Hu, Jerry I. Dadap, Jerry I. Dadap, Mark H. Anderson, Mark H. Anderson, M. ter Beek, M. ter Beek, Z. Xu, Z. Xu, N. M. Russell, N. M. Russell, John G. Ekerdt, John G. Ekerdt, P. S. Parkinson, P. S. Parkinson, E. D. Mishina, E. D. Mishina, Oleg A. Aktsipetrov, Oleg A. Aktsipetrov, Michael C. Downer, Michael C. Downer, } "New directions in surface spectroscopy enabled by ultrafast lasers", Proc. SPIE 3272, Laser Techniques for Surface Science III, (30 April 1998); doi: 10.1117/12.307114; https://doi.org/10.1117/12.307114
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