15 March 1998 Ultrahigh-density optical recording using a scanning near-field optical microscope
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Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35CIN2-O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable were shown by atomic force microscope images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuan Ying Lu, Yuan Ying Lu, Din Ping Tsai, Din Ping Tsai, Wen Rei Guo, Wen Rei Guo, Sheng-Chang Chen, Sheng-Chang Chen, Jia Reuy Liu, Jia Reuy Liu, Han-Ping D. Shieh, Han-Ping D. Shieh, } "Ultrahigh-density optical recording using a scanning near-field optical microscope", Proc. SPIE 3276, Miniaturized Systems with Micro-Optics and Micromechanics III, (15 March 1998); doi: 10.1117/12.302401; https://doi.org/10.1117/12.302401

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