9 June 1998 Modeling of optical properties in multilayer optical storage media
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Abstract
A computer model has been developed to calculate the optical properties (reflection and absorption coefficient) for various dye thicknesses between 20 and 300 nm for situation various reflecting layer Au or Al (Si). For a high k dye to power absorption being very critically dependent on dye thicknesses. In the less absorbing dye the situation be more extreme, with oscillatory interference effects causing considerable variations in absorption (reflection) from a maximum to a minimum every 50 - 70 nm (Au) and 100 - 120 nm (Al), and 150 nm (Si). A series of calculations are presented on a number of different layer structures and materials in an attempt to optimize the storage medium.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vasyliy G. Kravets, Vasyliy G. Kravets, Andrey A. Kryuchin, Andrey A. Kryuchin, Tatyana G. Karpeleva, Tatyana G. Karpeleva, Ekaterina L. Vinnichenko, Ekaterina L. Vinnichenko, Alexander V. Prygun, Alexander V. Prygun, } "Modeling of optical properties in multilayer optical storage media", Proc. SPIE 3282, Photosensitive Optical Materials and Devices II, (9 June 1998); doi: 10.1117/12.311535; https://doi.org/10.1117/12.311535
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