Paper
7 July 1998 Temperature-induced alpha factor
Cun-Zheng Ning
Author Affiliations +
Abstract
We study the temperature effects on gain, refractive index, and the linewidth enhancement (or alpha) factor in a 2D semiconductor. We consider both the standard alpha factor due to carrier density variation and that due to temperature variation. The so-called total alpha factor due to both carrier density and temperature is also studied. As a result of temperature change, the alpha factors can be positive, negative, or zero.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cun-Zheng Ning "Temperature-induced alpha factor", Proc. SPIE 3283, Physics and Simulation of Optoelectronic Devices VI, (7 July 1998); https://doi.org/10.1117/12.316690
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Cited by 1 scholarly publication.
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KEYWORDS
Plasma

Temperature metrology

Refractive index

Semiconductors

Thermal effects

Semiconductor lasers

Laser optics

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