2 January 1998 Microcluster line screens and frequency analyses
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Abstract
Microcluster halftoning is a hybrid approach between clustered-dot and dispersed-dot ordered dithers. The concept and design principles of microcluster dots have been published elsewhere. This paper reports the frequency analyses of microcluster line screens. First, the Fourier transform for the frequency-domain analysis is briefly reviewed. Several line screens are proposed, ranging from 8 to 144 levels. At each level, three dot growth patterns of the conventional, interlace, and microcluster line screens are provided. Frequency analyses of these screens and the corresponding dispersed-dot are presented and compared. Results indicate that the line screens can be made into high frequency and high tone levels. Generally, they behave like a dispersed dot in the highlight region, a line screen in the midtone region, and an inverted dispersed dot in the shadow region.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Henry R. Kang, "Microcluster line screens and frequency analyses", Proc. SPIE 3300, Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts III, (2 January 1998); doi: 10.1117/12.298294; https://doi.org/10.1117/12.298294
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