1 April 1998 Modeling and estimation of FPN components in CMOS image sensors
Author Affiliations +
Abstract
Fixed pattern noise (FPN) for a CCD sensor is modeled as a sample of a spatial white noise process. This model is, however, not adequate for characterizing FPN in CMOS sensors, since the redout circuitry of CMOS sensors and CCDs are very different. The paper presents a model for CMOS FPN as the sum of two components: a column and a pixel component. Each component is modeled by a first order isotropic autoregressive random process, and each component. Each component is modeled by a first order isotropic autoregressive random process, and each component is assumed to be uncorrelated with the other. The parameters of the processes characterize each component of the FPN and the correlations between neighboring pixels and neighboring columns for a batch of sensor. We show how to estimate the model parameters from a set of measurements, and report estimates for 64 X 64 passive pixel sensor (PPS) and active pixel sensor (APS) test structures implemented in a 0.35 micron CMOS process. High spatial correlations between pixel components were measured for the PPS structures, and between the column components in both PPS and APS. The APS pixel components were uncorrelated.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abbas El Gamal, Abbas El Gamal, Boyd A. Fowler, Boyd A. Fowler, Hao Min, Hao Min, Xinqiao Liu, Xinqiao Liu, } "Modeling and estimation of FPN components in CMOS image sensors", Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304560; https://doi.org/10.1117/12.304560
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

The comparison of CCD and CMOS image sensors
Proceedings of SPIE (February 02 2009)
Charge-coupled CMOS and hybrid detector arrays
Proceedings of SPIE (January 11 2004)
Fundamental study on identification of CMOS cameras
Proceedings of SPIE (August 07 2003)
Intelligent CMOS imaging
Proceedings of SPIE (April 09 1995)

Back to Top