Paper
1 April 1998 Electron bombardment CCD camera
Tadashi Maruno, Mashahiko Shirai, Fumio Iwase, Naotaka Hakamata
Author Affiliations +
Proceedings Volume 3302, Digital Solid State Cameras: Designs and Applications; (1998) https://doi.org/10.1117/12.304570
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
Two kinds of electron bombardment CCD (EB-CCD) camera are newly developed, employing an EB-CCD sensor made by Hamamatsu Photonics. The slow scan cooled CCD camera installs the full frame transfer type EB-CCD sensor with 512 X 512 pixel format and standard video rate camera installs the frame transfer type EB-CCD sensor with 658 X 490 pixel format. For slow scan camera, EB-CCD sensor is cooled down to -25 degree C to realize high sensitivity utilizing long exposure time and very low noise performance. And instead of mechanical shutter, high speed electrical gated function is installed in this camera. Standard video rate camera has a function of recursive filter and auto background subtraction as a standard in order to get high quality image. Furthermore, camera can select both inter- laced scan and progressive scan readout mode. These cameras have been compared with the other high sensitive camera like SIT camera, photon counting camera and I-CCD camera which results in proving that these EB-CCD camera are suitable and ideal.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tadashi Maruno, Mashahiko Shirai, Fumio Iwase, and Naotaka Hakamata "Electron bombardment CCD camera", Proc. SPIE 3302, Digital Solid State Cameras: Designs and Applications, (1 April 1998); https://doi.org/10.1117/12.304570
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KEYWORDS
Cameras

CCD cameras

CCD image sensors

Sensors

Charge-coupled devices

Photon counting

Microchannel plates

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