Paper
2 February 1998 Optoelectronic morphological processor for industrial online inspection
Haisong Liu, Minxian Wu, Guofan Jin, Gang Cheng, Qingsheng He
Author Affiliations +
Proceedings Volume 3306, Machine Vision Applications in Industrial Inspection VI; (1998) https://doi.org/10.1117/12.301237
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
An optoelectronic morphological processor for industrial on- line inspection is presented in this paper. The principle of the processor is based on the morphological hit-miss transform. By using an extensive complementary encoding method, which combines the foreground and background of an image into a whole, the hit-miss transform, which usually needs three steps to perform, can be implemented in only one step. The optical implementation hardware is based on an incoherent optical correlator due to its compactness in structure and immunity to coherent noise. The experimental results are given.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haisong Liu, Minxian Wu, Guofan Jin, Gang Cheng, and Qingsheng He "Optoelectronic morphological processor for industrial online inspection", Proc. SPIE 3306, Machine Vision Applications in Industrial Inspection VI, (2 February 1998); https://doi.org/10.1117/12.301237
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Cited by 1 scholarly publication.
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KEYWORDS
Optical correlators

Computer programming

Inspection

Optoelectronics

LCDs

Binary data

Image processing

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