1 January 1998 Microcharacteristics of vanadium films from optical investigations in the spectral range 0.2 - 50 μm
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Proceedings Volume 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics; (1998); doi: 10.1117/12.301349
Event: Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, 1996, Karpacz, Poland
Abstract
Optical properties of vanadium films have been investigated. Based on the measurements of reflection coefficient in 0.2 - 50 micrometer spectral range the optical constants of vanadium films were determined using Kramers-Kronig dispersion relations. Using the optical constants for a wide spectrum the electrical microcharacteristics of vanadium films were determined. Assuming the normal skin effect the electron collision rate and plasma frequency were calculated. The concentration of conduction electrons has been also determined. Making use of knowledge of resistivity in room temperature and in the temperature of liquid helium the electron-photon and electron-impurities collision rate contribution to the effective conduction electron collision rate has been estimated.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Krystyna Zukowska, Ewa Oleszkiewicz, Bonifacy Stolecki, "Microcharacteristics of vanadium films from optical investigations in the spectral range 0.2 - 50 μm", Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); doi: 10.1117/12.301349; https://doi.org/10.1117/12.301349
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KEYWORDS
Vanadium

Reflection

Dielectrics

Phase shifts

Optical properties

Plasma

Absorption

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