20 July 1998 Magnetoelastic properties of thin polycrystalline Terfenol-D films
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Abstract
In this paper we report on polycrystalline thin films sputter- deposited at elevated temperatures. The grain size of the films was changed by controlling the film thickness. A series of 4 samples with thicknesses ranging from 0.1 μm to 1 μm was studied. The magnetic properties of the films were characterized by vibrating sample magnetometer measurement technique. The magneto-mechanical properties of the films were determined by dynamic magneto-mechanical measurements. The coercivity of the films was found to increase linearly with decreasing film thickness. A sharp transition occurred for film thickness below 0.3 μm and the coercivity decreased to 100 Oe as the film thickness reached 0.1 μm. The saturation magnetization of the films was calculated from the magneto-mechanical measurements. The values were found to agree with those determined from the VSM measurements for all the samples but the thinnest film for which VSM and magneto-mechanical values diffracted by one order of magnitude. It is suggested that the low coercivity of the 0.1 μm film can be associated with the onset of superparamagnetism in the nanograins of the film.
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Cecile Bailly, Cecile Bailly, Quanmin Su, Quanmin Su, Manfred R. Wuttig, Manfred R. Wuttig, } "Magnetoelastic properties of thin polycrystalline Terfenol-D films", Proc. SPIE 3324, Smart Structures and Materials 1998: Smart Materials Technologies, (20 July 1998); doi: 10.1117/12.316879; https://doi.org/10.1117/12.316879
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