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27 July 1998 Detection and measurement of ice thickness using microprocessor-controlled resonant transducers
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Abstract
An ice detection system consisting of a resonant piezoelectric sensing-element and microprocessor control has been developed to automatically and distinctly sense ice and water films up to 0.5 mm thick. Accretion of ice and/or water on the sensor surface modifies the effective mass and/or stiffness of the vibrating transducer; these variations are sensed by measuring the changes in transducer resonant frequency. In case of ice films, resonant frequency of the transducer increases steadily from 14 kHz for a 0.06 mm-thick layer to 28 kHz when the ice film is 0.45 mm thick. In contrast, the transducer resonant frequency decreases slightly from 10 kHz for a 0.06 mm-thick layer of water to 9.5 kHz for a 0.45 mm-thick film. Repeatability experiments revealed test-to-test variations of 3.8% and 0.7% for ice and water films, respectively. A portable, low-power, microprocessor-controlled electronic circuit has been designed and implemented to automate the resonant frequency measurement and determine the thickness of ice/water present on the transducer surface.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuvo Roy, Alain Izad, Russell G. DeAnna, and Mehran Mehregany "Detection and measurement of ice thickness using microprocessor-controlled resonant transducers", Proc. SPIE 3329, Smart Structures and Materials 1998: Smart Structures and Integrated Systems, (27 July 1998); https://doi.org/10.1117/12.316899
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