5 June 1998 Minimizing mapping-induced OPD errors when testing aspheric mirrors
Author Affiliations +
Extreme UV (EUV) projection system are designed with mild spheres so that the mirrors can be tested at the center of curvature without null optics. The elimination of the null optics improves the fundamental accuracy of the test. However, this test configuration is not stigmatic, and the rays from the test wavefront and reference wavefront will not trace the same optical path through the viewing system. Effectively, the test and reference wavefront are sheared in the exit pupil of the viewing system. This shear leads to an OPD contribution from the viewing system that we label the mapping error. For visible light metrology, this induced OPD error can be a significant fraction of the EUV wavelength.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell M. Hudyma, Russell M. Hudyma, Gary E. Sommargren, Gary E. Sommargren, } "Minimizing mapping-induced OPD errors when testing aspheric mirrors", Proc. SPIE 3331, Emerging Lithographic Technologies II, (5 June 1998); doi: 10.1117/12.309561; https://doi.org/10.1117/12.309561

Back to Top