Paper
29 June 1998 Processing of acrylate-based 193-nm resists: influence of physico-chemical properties
Benedicte P. Mortini, Charles Rosilio, Alain Prola, Patrick Jean Paniez
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Abstract
The large variety of protecting groups that can be employed for acrylate based resists increases the number of mechanisms encountered when implementing these new materials. Some of these phenomena, related to both their physical and chemical properties, are investigated.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benedicte P. Mortini, Charles Rosilio, Alain Prola, and Patrick Jean Paniez "Processing of acrylate-based 193-nm resists: influence of physico-chemical properties", Proc. SPIE 3333, Advances in Resist Technology and Processing XV, (29 June 1998); https://doi.org/10.1117/12.312406
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KEYWORDS
Polymers

Ellipsometry

Annealing

FT-IR spectroscopy

Photoresist processing

Polymerization

Scanning electron microscopy

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