Paper
24 July 1998 Diffraction spectrometer for spectral analysis of mammographic x-ray sources
Tong Yu, John M. Boone
Author Affiliations +
Abstract
The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tong Yu and John M. Boone "Diffraction spectrometer for spectral analysis of mammographic x-ray sources", Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); https://doi.org/10.1117/12.317059
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KEYWORDS
X-rays

Diffraction

Spectroscopy

X-ray diffraction

Charge-coupled devices

Mammography

Solids

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