14 September 1998 Laser-induced back-ablation of aluminum thin films using picosecond laser pulses
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Proceedings Volume 3343, High-Power Laser Ablation; (1998) https://doi.org/10.1117/12.321549
Event: High-Power Laser Ablation, 1998, Santa Fe, NM, United States
Abstract
A study of Laser-Induced Back-Ablation of Aluminum thin film targets with picosecond laser pulses is reported. Ablated plume edge velocities are studied as a function of film thickness, laser pulsewidth, and incident laser fluence. Edge velocity results are compared to a model of total transmitted fluence incident at the substrate/film interface. A model including laser-induced avalanche ionization and multi-photon ionization mechanisms in the substrate shows a transmitted fluence limit which coincides with observed edge velocity limits.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anthony B. Bullock, Anthony B. Bullock, Paul Robert Bolton, Paul Robert Bolton, "Laser-induced back-ablation of aluminum thin films using picosecond laser pulses", Proc. SPIE 3343, High-Power Laser Ablation, (14 September 1998); doi: 10.1117/12.321549; https://doi.org/10.1117/12.321549
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