PROCEEDINGS VOLUME 3345
INTERNATIONAL WORKSHOP ON NEW APPROACHES TO HIGH TECH MATERIALS: NONDESTRUCTIVE TESTING AND COMPUTER SIMULATIONS IN MATERIALS SCIENCE AND ENGINEERING | 9-13 JUNE 1997
International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering
Editor(s): Alexander I. Melker
INTERNATIONAL WORKSHOP ON NEW APPROACHES TO HIGH TECH MATERIALS: NONDESTRUCTIVE TESTING AND COMPUTER SIMULATIONS IN MATERIALS SCIENCE AND ENGINEERING
9-13 June 1997
St. Petersburg, Russian Federation
Laser, Optical, and X-ray Technologies
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 2 (1 January 1998); doi: 10.1117/12.299568
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 6 (1 January 1998); doi: 10.1117/12.299579
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 11 (1 January 1998); doi: 10.1117/12.299590
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 16 (1 January 1998); doi: 10.1117/12.299601
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 19 (1 January 1998); doi: 10.1117/12.299612
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 24 (1 January 1998); doi: 10.1117/12.299618
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 29 (1 January 1998); doi: 10.1117/12.299619
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 33 (1 January 1998); doi: 10.1117/12.299620
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 37 (1 January 1998); doi: 10.1117/12.299621
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 40 (1 January 1998); doi: 10.1117/12.299569
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 45 (1 January 1998); doi: 10.1117/12.299570
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 51 (1 January 1998); doi: 10.1117/12.299571
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 55 (1 January 1998); doi: 10.1117/12.299572
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 61 (1 January 1998); doi: 10.1117/12.299573
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 76 (1 January 1998); doi: 10.1117/12.299574
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 79 (1 January 1998); doi: 10.1117/12.299575
Electronic and Optical Properties of Condensed Matter
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 92 (1 January 1998); doi: 10.1117/12.299576
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 98 (1 January 1998); doi: 10.1117/12.299577
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 106 (1 January 1998); doi: 10.1117/12.299578
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 112 (1 January 1998); doi: 10.1117/12.299580
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 118 (1 January 1998); doi: 10.1117/12.299581
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 122 (1 January 1998); doi: 10.1117/12.299582
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 129 (1 January 1998); doi: 10.1117/12.299583
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 136 (1 January 1998); doi: 10.1117/12.299584
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 143 (1 January 1998); doi: 10.1117/12.299585
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 152 (1 January 1998); doi: 10.1117/12.299586
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 157 (1 January 1998); doi: 10.1117/12.299587
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 162 (1 January 1998); doi: 10.1117/12.299588
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 166 (1 January 1998); doi: 10.1117/12.299589
Nanotechnology: Smart Materials and Soft Condensed Matter
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 176 (1 January 1998); doi: 10.1117/12.299591
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 178 (1 January 1998); doi: 10.1117/12.299592
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 184 (1 January 1998); doi: 10.1117/12.299593
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 187 (1 January 1998); doi: 10.1117/12.299594
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 193 (1 January 1998); doi: 10.1117/12.299595
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 198 (1 January 1998); doi: 10.1117/12.299596
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 202 (1 January 1998); doi: 10.1117/12.299597
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 206 (1 January 1998); doi: 10.1117/12.299598
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 216 (1 January 1998); doi: 10.1117/12.299599
Surfaces, Amorphization, and Ion Beam Technology
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 226 (1 January 1998); doi: 10.1117/12.299600
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 232 (1 January 1998); doi: 10.1117/12.299602
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 240 (1 January 1998); doi: 10.1117/12.299603
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 245 (1 January 1998); doi: 10.1117/12.299604
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 252 (1 January 1998); doi: 10.1117/12.299605
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 260 (1 January 1998); doi: 10.1117/12.299606
Computer Technology: Molecular Dynamics, Visualization, and Cognitives
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 266 (1 January 1998); doi: 10.1117/12.299607
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 272 (1 January 1998); doi: 10.1117/12.299608
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 281 (1 January 1998); doi: 10.1117/12.299609
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 285 (1 January 1998); doi: 10.1117/12.299610
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 289 (1 January 1998); doi: 10.1117/12.299611
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 293 (1 January 1998); doi: 10.1117/12.299613
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 296 (1 January 1998); doi: 10.1117/12.299614
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 303 (1 January 1998); doi: 10.1117/12.299615
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 305 (1 January 1998); doi: 10.1117/12.299616
Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, pg 313 (1 January 1998); doi: 10.1117/12.299617
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