1 January 1998 Electron optical properties of two-dimensional compressing electrostatic potential
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Proceedings Volume 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering; (1998) https://doi.org/10.1117/12.299584
Event: International Workshop on New Approaches to High Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, 1997, St. Petersburg, Russian Federation
Abstract
Some methods of electron, ion and photoelectron spectroscopy deal with very weak, strictly oriented beams of charged particles. Because of low beams intensity, these methods are substantially non-destructive, but on the other hand, the beam weakness limits severely their sensitivity and rapidity of spectra registration. Electron-optical characteristics of electrostatic potential (Phi) equals arctg(y/x) are considered. Compared to `traditional' fields used in energy analysis and monochromatization of electron beams, the potential (Phi) possesses some extra compressing feature. This gives additional possibility to enhance the entrance flows to be analyzed or monochromized, and as a result can allow to improve sensitivity and rapidity of some modern electron and ion spectroscopic methods.
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Sergey N. Davydov, Sergey N. Davydov, Sergei N. Romanov, Sergei N. Romanov, Yury K. Golikov, Yury K. Golikov, Vadim V. Korablev, Vadim V. Korablev, } "Electron optical properties of two-dimensional compressing electrostatic potential", Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, (1 January 1998); doi: 10.1117/12.299584; https://doi.org/10.1117/12.299584
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