Paper
1 January 1998 Phase image testing of the internal structure of x-ray transparent materials
Viktor N. Ingal, Elena A. Beliaevskaya
Author Affiliations +
Proceedings Volume 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering; (1998) https://doi.org/10.1117/12.299573
Event: International Workshop on New Approaches to High Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, 1997, St. Petersburg, Russian Federation
Abstract
A new technique for imaging an inner structure of x-ray transparent materials and biomedical objects characterized by small density changes of their structure components is presented. The phase imaging is based on two principal phenomena-radiation refraction in a tested object and diffraction in highly perfect crystals used both for creation of an incident beam and for imaging. It is shown that a phase radiography providing possibilities of an opacification free investigation of biomedical objects soft tissues can be developed upon the technique reported here.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Viktor N. Ingal and Elena A. Beliaevskaya "Phase image testing of the internal structure of x-ray transparent materials", Proc. SPIE 3345, International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering, (1 January 1998); https://doi.org/10.1117/12.299573
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KEYWORDS
X-rays

Crystals

Refraction

X-ray imaging

Computer simulations

Diffraction

Phase imaging

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