10 March 1998 Calculation controlled by electrical field elements of optical systems based on metal-dielectric-metal (MDM) structures
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Abstract
Emission currents in piezoelectric (PZ) transducers used in optoelectronic processing systems are considered. Charge carrier injection in dielectrics from metal electrodes lead to uneven polarization, piezo- and electrooptical properties distributions across thickness of thin layer MDM structures. Theory of these combined PZ and elastic-optical effects in ferroelectric PLZT-type ceramics is given. Mechanical stress-strain state and electromechanical flextensional effect in homogeneous PZ layer used in spatial light modulator are investigated in detail.
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Valentin M. Bogomol'nyi, "Calculation controlled by electrical field elements of optical systems based on metal-dielectric-metal (MDM) structures", Proc. SPIE 3348, Optical Information Science and Technology (OIST97): Computer and Holographic Optics and Image Processing, (10 March 1998); doi: 10.1117/12.302486; https://doi.org/10.1117/12.302486
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