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24 July 1998 Deep Space 3 metrology system
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Abstract
A metrology subsystem on board the Deep Space 3, a separated spacecraft interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and initial delay. The subsystem implements two capabilities: linear metrology for optical pathlength determination and angular metrology needed to determine the configuration and orientation of the spacecraft constellation. Frequency modulated metrology concept is used to implement high-precision (5nm) interferometric linear measurements over large target ranges (1km). System is made angle sensitive by using an articulated flat mirror at the target.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Serge Dubovitsky, Roger P. Linfield, Gary H. Blackwood, Peter W. Gorham, Michael Shao, William M. Folkner, and Jeffrey W. Yu "Deep Space 3 metrology system", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317103
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