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24 July 1998 Metrology source for high-resolution heterodyne interferometer laser gauges
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Abstract
We describe the development, functional performance, and space-qualification status of a Metrology Source suitable for implementation of space-based metrology systems with picometer-level relative displacement measurement and micron-level absolute displacement measurement resolution. The Metrology Source consists of the following components: lasers, frequency stabilization system, frequency shifters, and frequency modulators. All components are interconnected by polarization maintaining fibers to facilitate integration into a lightweight space-qualifiable module.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Serge Dubovitsky, David J. Seidel, Duncan Tsuen-Hsi Liu, and Roman C. Gutierrez "Metrology source for high-resolution heterodyne interferometer laser gauges", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317166
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